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983C98B37672
• “Solid State Systems 0xBE” is the internal (Mass-Production-Tool) code for an SSS6692-BE USB-flash-drive controller made by Solid State Systems Inc.
• “983C98B37672” is the 6-byte NAND Flash ID that decodes to a Toshiba / KIOXIA 128 Gbit (16 GB per die) TLC/MLC Toggle-DDR NAND device (part family TC58TFG8T2x / TC58NC66xx).
• Together they describe the exact controller/flash pairing typically found in 32 GB GoodRam or other OEM pendrives.
Key points
– Controller: SSS6692-BE (USB 2.0/USB 3.0, UFD class, supports 1CE/4CE NAND).
– Flash: Toshiba/KIOXIA, JEDEC manf. code 0x98, 128 Gbit die, 16 K page, Toggle-DDR 1.0/2.0.
– Relevant for firmware repair, low-level formatting, or data-recovery tool selection.
Controller identification
• Vendor ID: Solid State Systems (SSS, Taiwan)
• Family: SSS66xx (2013-2016 generation).
• MP-tools label the -BE firmware branch simply “0xBE”. Hence ChipGenius/FDI shows:
“Controller Vendor : Solid State Systems
Controller Part-Number : Unknown(0xBE)”.
• Hardware features
– USB 2.0 High-Speed (some -BE lots also carry internal USB 3.0 PHY but usually routed as HS).
– 8051-based MCU, integrated ECC engine (BCH 40-bit/1024 B), wear-levelling + FTL.
– Supports 1–4 CE, Toggle or ONFI 2.x NAND at up to 200 MT/s.
NAND Flash identification (983C98B37672)
The first byte (0x98) is the standard JEDEC code for Toshiba / KIOXIA.
A typical Toshiba Toggle-DDR ID layout is
• 1st byte – Manufacturer (0x98 = Toshiba)
• 2nd byte – Device, density & organisation (0x3C → 128 Gbit, 2 kB/8 kB/16 kB page families)
• 3rd-6th bytes – internal revision, voltage, interface, ECC requirement.
Cross-references in Toshiba datasheets and recovery databases map 98 3C 98 B3 76 72 to
– TC58TFG8T22/23TA0D (TLC, 16 kB page) or
– TC58NC6626G6F (MLC, 8 kB page, older lot).
Two such dies (2 × 128 Gbit = 256 Gbit) give 32 GB user capacity after formatting/over-provision.
Why these codes matter
• Mass-Production (MP) or Repair tools need both controller code and Flash ID to load an appropriate configuration table (timings, die map, ECC strength, bad-block table format).
• Firmware corruption, vendor-specific write-protection, or exhausted bad-block reserve will cause symptoms such as “0 MB”, “no media”, or write errors. Selecting a mismatched Flash-table bricks the drive.
Typical failure scenario
– Drive suddenly shows 8 MB/0 MB → FTL metadata lost.
– ChipGenius reports SSS 0xBE, FlashID 98 3C … but no capacity.
– The fix is a low-level re-initialisation with SSS MPTool v2.xx that contains the 98 3C98B3 table.
• SSS controllers are gradually disappearing from new UFDs; Phison PS2251-xx and SiliconMotion SM328x dominate today.
• KIOXIA’s replacement parts keep the same manufacturer byte (0x98) but move to BiCS4/5 QLC; repair tools therefore need updated flash-tables (>2022 releases).
• Community-maintained databases (usbdev.ru, elektroda.pl) are still the primary source for legacy MPTools because SSS stopped public distribution after 2017.
• Hex-ID vs Device Name: NAND vendors rarely publish the mapping; reverse-engineering by recovery labs populates public lists.
• Toggle-DDR vs ONFI: Toggle uses DQS strobe similar to SDRAM, giving higher bandwidth on the same 8-bit bus. Controller firmware must match the interface.
• FTL (Flash Translation Layer): Holds logical-to-physical tables, wear counters, and bad-block lists in hidden meta-blocks; when corrupted the controller enumerates but exposes no LUN → “0 MB”.
Example workflow for repair
• Mass-production utilities are usually NDA-covered; redistributing them may breach licensing.
• Re-flashing destroys all user data – explicit consent of the owner is mandatory.
• Chip-off recovery involves handling of personal data; GDPR/CCPA rules apply if the data belong to third parties.
• Ensure electrical safety when shorting test-pads to force “Test-Mode”.
Implementation
– Prefer a native USB 2.0 port on Intel/AMD root hub (no hubs, no USB-C adapters).
– Disable power-save for USB in BIOS/OS to prevent brown-out during long erase cycles.
Best practices
– Keep two different MPTool versions; if one fails at 10 %, switch to another build.
– After successful low-level format, perform Windows “Full format”, not “Quick”, to force every block write/verify.
Challenges & mitigation
– “Flash ID not supported”: edit *.ini to insert the table or hunt a newer DB file.
– “Too many bad blocks”: the NAND is genuinely worn; drive is scrap.
• Drives repaired this way are suitable for non-critical use only; wear-levelling tables start from zero but underlying P/E cycles are already consumed.
• Some GoodRam batches used epoxy-potted COB packages; if the device does not enumerate at all, hardware rework is impractical.
• Investigate open-source FTL alternatives (Open-NAND-Flash-Manager) for legacy controllers.
• Explore FPGA-based universal NAND readers that can auto-reconstruct SSS FTL layouts for chip-off recovery.
• Monitor KIOXIA BiCS6 Flash ID evolution to keep repair databases up-to-date.
“Solid State Systems 0xBE 983C98B37672” uniquely identifies a USB flash drive built around an SSS6692-BE controller and Toshiba/KIOXIA 128 Gbit Toggle-DDR NAND dies. Knowledge of these two codes is essential when selecting a compatible Mass-Production tool for low-level formatting or data-recovery operations. While a firmware re-initialisation can often revive a “dead” 32 GB pendrive, it irretrievably erases existing data and offers no guarantee of long-term reliability.
