I am not an EE, just a lowly programmer, but need to develop a model for the aging of a machine's drives due to thermal stressing of the wire bonds. In the real world the drives will undergo thermal cycling every ~3 seconds with variable cycle amplitude and spacing in time, and we want to run an accelerated test with more frequency cycles that hit the max amplitude each time. The trick is, the only thing I can predict in the real world is power, not the heating of the drive, though we can measure heating in the test. I am supposed to estimate the acceleration factor of the test. Is there an industry model for this, where drive life is a function of power cycling? Any basic references on drive aging would be a lifeline.
