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Generating Skewed Load Test Cubes and Low Power Test Sets in VLSI Testing

Generating Skewed Load Test Cubes and Low Power Test Sets in VLSI Testing

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#1 21674850 10 Nov 2015 04:32

venu madhavi venu madhavi

Anonymous

Post #1
21674850 10 Nov 2015 04:32

1.how to generate skewed load test cubes from functional broadside test cubes?
2.how to merge two test cubes such that the fault coverage is not changed?
3.how to generate low power test sets in vlsi testing?
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#2 21674851 10 Nov 2015 22:39

Noreen Ras Noreen Ras

Anonymous

Post #2
21674851 10 Nov 2015 22:39

I think the low-power test generation procedure can be a good option for your concern in no. 1. I'm not sure how efficient it is, but there are few studies about it. Have you considered Test Point Insertion for merging 2 test cubes?

Check this paper on Low-power testing in VLSI Circuits http://dit.upc.es/lpdntt/biblio/BREUS/GIR02a.pdf
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Generating Skewed Load Test Cubes and Low Power Test Sets in VLSI Testing

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