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Multilayer Ceramic Capacitor (MLCC) failure root cause analysis

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  • #1 21663247
    Patrick Walsh
    Anonymous  
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  • #2 21663248
    stephen Van Buskirk
    Anonymous  
  • #3 21663249
    Steve Lawson
    Anonymous  
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  • #4 21663250
    Kevin Parmenter
    Anonymous  
  • #5 21663251
    Mark Harrington
    Anonymous  
  • #6 21663252
    Mark Harrington
    Anonymous  
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  • #7 21663253
    Gary Crowell
    Anonymous  
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  • #8 21663254
    Todd Hayden
    Anonymous  
  • #9 21663255
    Radek Susina
    Anonymous  
  • #10 21663256
    Matt Alizadeh
    Anonymous  
  • #11 21663257
    Radek Susina
    Anonymous  

Topic summary

A consumer product experienced a sudden 4% failure rate of a specific 10 µF Y5V dielectric MLCC capacitor manufactured by Samsung, exhibiting severe leakage currents from 0.1 mA to 4 mA. Despite identical capacitors on the board, only one failed, suggesting localized damage possibly during or after PCBA or final assembly. Poor ESD control was noted but deemed unlikely as the root cause. Potential causes discussed include microcracks from mechanical or thermal stress, soldering temperature issues especially with unleaded solder, and operating voltage margins being too tight. Testing recommendations included ESR and frequency response analysis to gather diagnostic data for the supplier. Mechanical damage during assembly processes such as hand screw installation or PCB depaneling was highlighted as a probable cause, with one case identifying PCB bending during cutting as a failure source leading to moisture absorption and leakage increase over time. Solutions involved changing capacitor batches, improving mechanical handling, adjusting PCB panel design to include bridges to reduce bending stress, and consulting the manufacturer for support.
Summary generated by the language model.
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